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Subject: Re: MC14007-IC

Date: 11/22/01 at 9:25 AM
Posted by: David Ashby
E-mail: dashby@quin.co.uk
Message Posted:

In Reply to: Re: MC14007-IC posted by Baris Aydinoz on 11/21/01 at 11:31 AM:

Just my .02 worth:

The CD4007 is simply 5 individual MOS transistors in a 14-pin D.I.L. package, so testing them individually is certainly feasible. I don't know of any published method, but National Semiconductor might have an application note about this - otherwise, you'll just need to devise your own test jig. This can be as complex or simple as the application requires - it all depends on what characteristics you want to measure.

David Ashby.

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