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Subject: Re: MC14007-IC

Date: 11/21/01 at 4:57 PM
Posted by: John Dunn - Consultant
E-mail: ambertec@ieee.org
Message Posted:

In Reply to: Re: MC14007-IC posted by Baris Aydinoz on 11/21/01 at 11:31 AM:

Hi, Baris.

The task of testing the individual mosfet transistors within the chip as opposed to testing the entire chip itself is something new to me. I have no idea where to suggest that you begin.

Perhaps someone can offer some suggestions here???

John Dunn - President
Ambertec, Inc.
ambertec@ieee.org


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