In Reply to: Job Opportunity - Process Development Engineer posted by Clayton M. Gilman - Gilman Associates on 07/10/00 at 8:53 AM:
CURRICULUM VITAE
Name: Reuben Dahan (Ph.D.)
Date and Place of birth: November 27, 1959, Israel.
Nationality: Israeli.
Home/mailing address: 2 Kidron St.,
Zur-Yigal
44862, Israel.
Tel: (972)-9-7496167
(972)-52-682796
E-mail: dahanr@netvision.net.il
PROFESSIONAL EXPERIENCE:
2001-2002 Red-C Optical Networks, Senior Physics.
1995-2001 EL-OP - Thin film researcher, Head of Technologies & Development.
1994-1995 SOCARD- Software project manager.
1990-1995 I.C.P.C- Application Engineer, Computer Interfacing.
SUBJECTS:
Optical Thin Films - Fabrication Methods: Thermal evaporation, e-gun evaporation, IAD, Sputtering, Ion-Beam Sputtering.
Optical Thin Films – Design & Development: Design of several types of coating including Anti-reflective, Beam splitters, High-pass filters, Low-pass filters, Band-pass filters, both for VIS and IR. WDM coatings. Coating on different type substrates including BK7, Quartz, Si, Ge, etc.
Optical Measurements: Transmission and Reflection, Optical film characterization, Scattering measurements, Ellipsometric and polarization measurements.
Materials Science - Analysis & Characterization Methods: X-ray, SEM, TEM, Auger, Hall effect, Thickness measurements, Micro-Hardness measurements.
Computer Languages & Softwares: Windows, Visual Basic, TF Calc, FilmStar, Matlab, Excel, Autocad.
Computer Hardware: GPIB, Serial Communication, A/D D/A, Interfacing computer with Mechanical, Optical, and Measurements Systems.
ACADEMIC TRAINING:
1996 Ph.D. Electrical Engineering -- Tel-Aviv University Dept. of Electrical Engineering -- Physical Electronics, Tel-Aviv, Israel.
Subject of Thesis: The Influence of the Characteristics of Guiding Metal/Dielectric Layers in Hollow Fibers on their Energy Transmission.
Name of Supervisor: Prof. N.Croitoru.
1989 M.Sc. Electrical Engineering -- Tel-Aviv University Dept. of Electrical Engineering -- Physical Electronics, Tel-Aviv, Israel.
Subject of Thesis: Characterization of Ti:LiNbO3 Waveguides.
Name of Supervisors: Prof. N.Croitoru, Prof. S.Ruschin.
1985 B.Sc. (Cum laude), Material Engineering - Ben Gurion University, Beer-Sheva, Israel.
Project (Cum laude): Formation of Ti/Ta Si.
Name of supervisors: Prof. J.Peleg, Prof. L.Zavin.
PATENT:
N.Croitou, J.Dror, I.Gannot and R.Dahan: Hollow waveguide for controlling beam divergence and method of making such tips; US Patent 5,497,441, Mar. 5, 1996.