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Subject: Re: interference fringes technique for stress measurment

Date: 05/02/01 at 2:50 PM
Posted by: Benyounes Elmrabat
E-mail: maroc@tomaatnet.nl
Message Posted:

In Reply to: Re: interference fringes technique for stress measurment posted by Vasco Teixeira on 04/20/01 at 5:40 PM:

There have been few reactions about my first e-mail, thankx . But i didn't
get yet the right information.
Therefore let me put it this way :
You have a Silicon wafer with SiO2 - SiON dubel layer. I can see at the edge
two spectres of fringes.
Some of the wafers have 2 fringes, others three. My question is :
Those the number of fringes inform you on the number of layers ? that's
optics !!!
Second question : how technically speaking can you get these spectres of
fringes ?

Thankx for your time.


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